Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings /

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Bibliographic Details
Main Author: Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick Ridder (edición)
Format: Book
Language:English
Published: Berlín, Alemania : Springer, 2006, c2006
Series:(Lecture Notes in Computer Science)
Online Access:Ver documento en línea
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