Dit-Yan Yeung, J. T. K. Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings. Springer.
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Cita estilo Chicago (17a ed.)
Dit-Yan Yeung, James T. Kwok. Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings. Berlín, Alemania: Springer.
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Cita MLA (9a ed.)
Dit-Yan Yeung, James T. Kwok. Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings. Springer.
Copiado correctamente al portapapeles
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