Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials : Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002 /
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| Үндсэн зохиолч: | |
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| Формат: | Ном |
| Хэл сонгох: | англи |
| Хэвлэсэн: |
Dordrecht, Holanda :
Springer,
2005, c2005
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| Цуврал: | (NATO Science Series II: Mathematics, Physics and Chemistry)
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| Онлайн хандалт: | Ver documento en línea |
| Шошгууд: |
Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!
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