Atomic Scale Characterization and First-Principles Studies of Si.N. Interfaces /
I tiakina i:
| Kaituhi matua: | |
|---|---|
| Hōputu: | Pukapuka |
| Reo: | Ingarihi |
| I whakaputaina: |
Nueva York, EUA :
Springer,
2011, c2011
|
| Rangatū: | (Springer Theses)
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| Urunga tuihono: | Ver documento en línea |
| Ngā Tūtohu: |
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
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