Atomic Scale Characterization and First-Principles Studies of Si.N. Interfaces /
Guardado en:
| Hovedforfatter: | |
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| Format: | Bog |
| Sprog: | engelsk |
| Udgivet: |
Nueva York, EUA :
Springer,
2011, c2011
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| Serier: | (Springer Theses)
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| Online adgang: | Ver documento en línea |
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Lignende værker: Atomic Scale Characterization and First-Principles Studies of Si.N. Interfaces /
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