Cita APA (7th ed.)
Weronika Walkosz. Atomic Scale Characterization and First-Principles Studies of Si.N. Interfaces. Springer.
Cita Chicago (17th ed.)
Weronika Walkosz. Atomic Scale Characterization and First-Principles Studies of Si.N. Interfaces. Nueva York, EUA: Springer.
Cita MLA (9th ed.)
Weronika Walkosz. Atomic Scale Characterization and First-Principles Studies of Si.N. Interfaces. Springer.
Atenció: Aquestes cites poden no estar 100% correctes.