Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials : Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002 /
Gorde:
| Egile nagusia: | |
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| Formatua: | Liburua |
| Hizkuntza: | ingelesa |
| Argitaratua: |
Dordrecht, Holanda :
Springer,
2005, c2005
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| Saila: | (NATO Science Series II: Mathematics, Physics and Chemistry)
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| Sarrera elektronikoa: | Ver documento en línea |
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