Anomalous X-Ray Scattering for Materials Characterization : Atomic-Scale Structure Determination /
I tiakina i:
| Kaituhi matua: | |
|---|---|
| Hōputu: | Pukapuka |
| Reo: | Ingarihi |
| I whakaputaina: |
Berlín, Alemania :
Springer,
2002, c2002
|
| Rangatū: | (Springer Tracts in Modern Physics)
|
| Urunga tuihono: | Ver documento en línea |
| Ngā Tūtohu: |
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
|
Me noho koe te mea tuatahi ki te waiho tākupu!