Anomalous X-Ray Scattering for Materials Characterization : Atomic-Scale Structure Determination /
Guardat en:
| Autor principal: | |
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| Format: | Llibre |
| Idioma: | anglès |
| Publicat: |
Berlín, Alemania :
Springer,
2002, c2002
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| Col·lecció: | (Springer Tracts in Modern Physics)
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| Accés en línia: | Ver documento en línea |
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