Anomalous X-Ray Scattering for Materials Characterization : Atomic-Scale Structure Determination /
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| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Berlín, Alemania :
Springer,
2002, c2002
|
| Series: | (Springer Tracts in Modern Physics)
|
| Online Access: | Ver documento en línea |
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