Measuring Intelligence : An Explanation of and a Complete Guide for the Use of the Stanford Revision and Extension of the Binet-Simon Intelligence Scale /

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Bibliographic Details
Main Author: Terman, Lewis M. (autor)
Other Authors: Merril, Maud A.
Format: Book
Language:English
Published: Boston, EUA : Houghton Mifflin, 1937, c1937
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Holdings details from IT2
Call Number:
153. 93 TER
Ejemplar 013984
Interno 4 horas supervisado
Collection:
Libros Antiguos y Raros