Yield and Reliability in Microwave Circuits and System Design /

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Kaituhi matua: Meehan, Michael D. (autor)
Ētahi atu kaituhi: Purviance, John (autor) (autor), Spence, Robert (prólogo) (prólogo)
Hōputu: Pukapuka
Reo:Ingarihi
I whakaputaina: Boston, EUA : Artech House, 1993, c1993
Rangatū:(Artech House Microwave Library)
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