Cita APA (7a ed.)
Meehan, M. D., Purviance, J., & Spence, R. (1993). Yield and Reliability in Microwave Circuits and System Design. Artech House.
Cita estilo Chicago (17a ed.)
Meehan, Michael D., John Purviance, y Robert Spence. Yield and Reliability in Microwave Circuits and System Design. Boston, EUA: Artech House, 1993.
Cita MLA (9a ed.)
Meehan, Michael D., et al. Yield and Reliability in Microwave Circuits and System Design. Artech House, 1993.
Precaución: Estas citas no son 100% exactas.