CCD Image Sensors in Deep-Ultraviolet : Degradation Behavior and Damage Mechanisms /
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| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
Berlín, Alemania :
Springer,
2005, c2005
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| Schriftenreihe: | (Microtechnology and MEMS)
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| Online-Zugang: | Ver documento en línea |
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