Atom Probe Microscopy /
Sábháilte in:
| Príomhchruthaitheoir: | |
|---|---|
| Formáid: | LEABHAR |
| Teanga: | Béarla |
| Foilsithe / Cruthaithe: |
Nueva York, EUA :
Springer,
2012, c2012
|
| Sraith: | (Springer Series in Materials Science)
|
| Rochtain ar líne: | Ver documento en línea |
| Clibeanna: |
Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!
|
Míreanna comhchosúla: Atom Probe Microscopy /
- Acoustic Scanning Probe Microscopy /
- Scanning Probe Microscopy in Nanoscience and Nanotechnology /
- Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces /
- Local Electrode Atom Probe Tomography : A User's Guide /
- Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 /
- Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 /