Physical Principles of Electron Microscopy : An Introduction to TEM, SEM, and AEM /
Tallennettuna:
| Päätekijä: | |
|---|---|
| Aineistotyyppi: | Kirja |
| Kieli: | englanti |
| Julkaistu: |
Nueva York, EUA :
Springer,
2005, c2005
|
| Linkit: | Ver documento en línea |
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