Infrared Ellipsometry on Semiconductor Layer Structures : Phonons, Plasmons, and Polaritons /
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| Autor Principal: | |
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| Formato: | Libro |
| Idioma: | inglés |
| Publicado: |
Berlín, Alemania :
Springer,
2004, c2004
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| Series: | (Springer Tracts in Modern Physics)
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| Acceso en liña: | Ver documento en línea |
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