Transmission Electron Microscopy : Physics of Image Formation and Microanalysis /
Guardat en:
| Autor principal: | |
|---|---|
| Format: | Llibre |
| Idioma: | anglès |
| Publicat: |
Berlín, Alemania :
Springer,
1997, c1997
|
| Edició: | 4a edición |
| Col·lecció: | (Springer Series in Optical Sciences)
|
| Accés en línia: | Ver documento en línea |
| Etiquetes: |
Sense etiquetes, Sigues el primer a etiquetar aquest registre!
|
Ítems similars: Transmission Electron Microscopy :
- Transmission Electron Microscopy : Physics of Image Formation /
- Scanning Electron Microscopy : Physics of Image Formation and Microanalysis /
- Scanning Transmission Electron Microscopy : Imaging and Analysis /
- Transmission Electron Microscopy of Semiconductor Nanostructures : An Analysis of Composition and Strain State /
- Sample Preparation Handbook for Transmission Electron Microscopy : Techniques /
- Sample Preparation Handbook for Transmission Electron Microscopy : Methodology /