Cita APA (7a ed.)
Wang, L., Stroud, C. E., & Touba, N. A. System-on-Chip Test Architectures: Nanometer Design for Testability. Morgan Kaufmann.
Cita estilo Chicago (17a ed.)
Wang, Laung-Terng, Charles E. Stroud, y Nur A. Touba. System-on-Chip Test Architectures: Nanometer Design for Testability. Burlington, EUA: Morgan Kaufmann.
Cita MLA (9a ed.)
Wang, Laung-Terng, et al. System-on-Chip Test Architectures: Nanometer Design for Testability. Morgan Kaufmann.
Precaución: Estas citas no son 100% exactas.