Cita APA (7a ed.)
Wang, L., Wu, C., & Wen, X. VLSI Test Principles and Architectures: Design for Testability. Morgan Kaufmann.
Cita estilo Chicago (17a ed.)
Wang, Laung-Terng, Cheng-Wen Wu, y Xiaoqing Wen. VLSI Test Principles and Architectures: Design for Testability. San Francisco, EUA: Morgan Kaufmann.
Cita MLA (9a ed.)
Wang, Laung-Terng, et al. VLSI Test Principles and Architectures: Design for Testability. Morgan Kaufmann.
Precaución: Estas citas no son 100% exactas.