Maunder, C. M., & Tulloss, R. E. The Test Access Port and Boundary Scan Architecture. IEEE Computer Society.
Copiat
No s'ha pogut copiar
Cita Chicago (17th ed.)
Maunder, Colin M., i Rodham E. Tulloss. The Test Access Port and Boundary Scan Architecture. Washington, EUA: IEEE Computer Society.
Copiat
No s'ha pogut copiar
Cita MLA (9th ed.)
Maunder, Colin M., i Rodham E. Tulloss. The Test Access Port and Boundary Scan Architecture. IEEE Computer Society.
Copiat
No s'ha pogut copiar
Atenció: Aquestes cites poden no estar 100% correctes.