Terman, L. M., & Merril, M. A. Measuring Intelligence: A Guide to the Administration of the New Revised Stanford-Binet Tests of Intelligence. Houghton Mifflin.
Copiat
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Cita Chicago (17th ed.)
Terman, Lewis M., i Maud A. Merril. Measuring Intelligence: A Guide to the Administration of the New Revised Stanford-Binet Tests of Intelligence. Boston, EUA: Houghton Mifflin.
Copiat
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Cita MLA (9th ed.)
Terman, Lewis M., i Maud A. Merril. Measuring Intelligence: A Guide to the Administration of the New Revised Stanford-Binet Tests of Intelligence. Houghton Mifflin.
Copiat
No s'ha pogut copiar
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