Cita APA (7a ed.)
David Zhang, A. K. J. Advances in Biometrics: International Conference, ICB 2006, Hong Kong, China, January 5-7, 2006, Proceedings. Springer.
Cita estilo Chicago (17a ed.)
David Zhang, Anil K. Jain. Advances in Biometrics: International Conference, ICB 2006, Hong Kong, China, January 5-7, 2006, Proceedings. Berlín, Alemania: Springer.
Cita MLA (9a ed.)
David Zhang, Anil K. Jain. Advances in Biometrics: International Conference, ICB 2006, Hong Kong, China, January 5-7, 2006, Proceedings. Springer.
Precaución: Estas citas no son 100% exactas.