Cita APA (7a ed.)
Stefan Rein. Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications. Springer.
Cita estilo Chicago (17a ed.)
Stefan Rein. Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications. Berlín, Alemania: Springer.
Cita MLA (9a ed.)
Stefan Rein. Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications. Springer.
警告：这些引文格式不一定是100％准确.