Cita APA (7a ed.)
IEEE Computer Society. Test Technology Technical Committee. IEEE Standard Test Access Port and Boundary: Scan Architecture. IEEE Computer Society.
Cita estilo Chicago (17a ed.)
IEEE Computer Society. Test Technology Technical Committee. IEEE Standard Test Access Port and Boundary: Scan Architecture. Nueva York, EUA: IEEE Computer Society.
Cita MLA (9a ed.)
IEEE Computer Society. Test Technology Technical Committee. IEEE Standard Test Access Port and Boundary: Scan Architecture. IEEE Computer Society.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.