Roberts, G. W., & Lu, A. K. Analog Signal Generation for Built-in-Self-Test of Mixed-Signal Integrated Circuits. Kluwer.
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Cita estilo Chicago (17a ed.)
Roberts, Gordon W., y Albert K. Lu. Analog Signal Generation for Built-in-Self-Test of Mixed-Signal Integrated Circuits. Boston, EUA: Kluwer.
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Cita MLA (9a ed.)
Roberts, Gordon W., y Albert K. Lu. Analog Signal Generation for Built-in-Self-Test of Mixed-Signal Integrated Circuits. Kluwer.
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