APA(7版)引用形式
Bushnell, M. L., & Agrawal, V. D. Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits. Kluwer.
Chicagoスタイル(17版)引用形式
Bushnell, Michael L., , Vishwani D. Agrawal. Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits. Boston, EUA: Kluwer.
MLA(9版)引用形式
Bushnell, Michael L., , Vishwani D. Agrawal. Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits. Kluwer.
警告: この引用は必ずしも正確ではありません.