Cita APA (7a ed.)
Beiser, L. Unified Optical Scanning Technology. Wiley ; IEEE.
Cita estilo Chicago (17a ed.)
Beiser, Leo. Unified Optical Scanning Technology. Hoboken, EUA : Nueva York, EUA: Wiley ; IEEE.
Cita MLA (9a ed.)
Beiser, Leo. Unified Optical Scanning Technology. Wiley ; IEEE.
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