Cita APA (7a ed.)
Moyne, J., Castillo, E. d., & Hurwitz, A. M. Run-to-Run Control in Semiconductor Manufacturing. CRC Press.
Cita estilo Chicago (17a ed.)
Moyne, James, Enrique del Castillo, y Arnon Max Hurwitz. Run-to-Run Control in Semiconductor Manufacturing. Boca Ratón, EUA: CRC Press.
Cita MLA (9a ed.)
Moyne, James, et al. Run-to-Run Control in Semiconductor Manufacturing. CRC Press.
Precaución: Estas citas no son 100% exactas.